A 100-ps time-resolution CMOS time-to-digital converter for positron emission tomography imaging applications

IEEE Journal of Solid-State Circuits

Volumn 39, Issue 11, 2004, Pages 1839-1852

  Swann, Brian K ^a   Blalock, Benjamin J ^b   Clonts, Lloyd G ^c   Binkley, David M ^a,d   Rochelle, James M ^a   Breeding, Eric ^e   Baldwin, K Michelle ^e  

^a Concorde Microsystems Inc ^*  (United States)

^b University of Tennessee Knoxville   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d University of North Carolina at Charlotte   (United States)

^e CPS Innovations   (United States)

Author keywords

Analog to digital converter (ADC); CMOS; Comparators; Offset correction; Positron emission tomography (PET); Sub nanosecond timing; Time to amplitude converter (TAC); Time to digital converter (TDC)

Indexed keywords

ANALOG TO DIGITAL CONVERSION; GAMMA RAYS; IMAGING TECHNIQUES; PHOTONS; POSITRON EMISSION TOMOGRAPHY; SIGNAL TO NOISE RATIO; TEST FACILITIES; TIME MEASUREMENT;

COMPARATORS; OFFSET CORRECTION; SUB-NANOSECOND TIMING; TIME-TO-AMPLITUDE CONVERTER (TAC); TIME-TO-DIGITAL CONVERTER (TDC);

CMOS INTEGRATED CIRCUITS;

EID: 8344276763     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.835832     Document Type: Article

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