-
2
-
-
33845581093
-
-
th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 356-363.
-
th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 356-363.
-
-
-
-
3
-
-
33845588217
-
Drop Impact Analysis of Sn-Ag-Cu Solder Joints Using Dynamic High-Strain Rate Plastic Strain as the Impact Damage Driving Force
-
May 30-June 2, San Diego, California, pp
-
th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 49-54.
-
(2006)
th Electronic Components and Technology Conf
, pp. 49-54
-
-
Pang, J.H.L.1
Che, F.X.2
-
4
-
-
33646383102
-
-
Chong, Desmond Y.R., Che, F.X, et al, Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages, Microelectronics Reliability, 46/7 (2006) pp. 1160-1171.
-
Chong, Desmond Y.R., Che, F.X, et al, "Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages", Microelectronics Reliability, Vol 46/7 (2006) pp. 1160-1171.
-
-
-
-
5
-
-
33845567770
-
Modeling Board-Level Four-Point Bend Fatigue and Impact Drop Tests
-
May 30-June 2, San Diego, California, pp
-
th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 443-448.
-
(2006)
th Electronic Components and Technology Conf
, pp. 443-448
-
-
Che, F.X.1
-
6
-
-
2942740958
-
Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test
-
Tee, T.Y., Ng, H.S., Lim, C.T., et al, "Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test", Microelectronics Reliability, Vol. 44, (2004), pp. 1131-1142.
-
(2004)
Microelectronics Reliability
, vol.44
, pp. 1131-1142
-
-
Tee, T.Y.1
Ng, H.S.2
Lim, C.T.3
-
7
-
-
4444374713
-
Flip Chip on Board: Assessment of Reliability in Cellular Phone Application
-
Sillanpää, M, Okura J.H., "Flip Chip on Board: Assessment of Reliability in Cellular Phone Application", IEEE Trans-Components and Packaging Technologies, Vol. 27, No.3(2004), pp.461-467.
-
(2004)
IEEE Trans-Components and Packaging Technologies
, vol.27
, Issue.3
, pp. 461-467
-
-
Sillanpää, M.1
Okura, J.H.2
-
8
-
-
0038351732
-
Modeling Technique for Reliability Assessment of Portable Electronic Product Subjected to Drop Impact Loads
-
New Orleans
-
rd Electronic Components and Technology Conf, New Orleans, 2003, pp. 100-104.
-
(2003)
rd Electronic Components and Technology Conf
, pp. 100-104
-
-
Zhu, L.P.1
-
9
-
-
24644473712
-
A Methodology for Drop Performance Prediction and Application for Design Optimization of Chip Scale Packages
-
Lake Buena Vista, FL, June
-
th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, pp. 472-479.
-
(2005)
th Electronic Components and Technology Conf
, pp. 472-479
-
-
Syed, A.1
-
11
-
-
0038451605
-
Board Level Solder Joint Reliability Modeling and Testing of TFBGA Packages for Telecommunication Applications
-
Tee, T.Y., et al, "Board Level Solder Joint Reliability Modeling and Testing of TFBGA Packages for Telecommunication Applications", Microelectronics Reliability, 43 (2003), pp. 1117-1123..
-
(2003)
Microelectronics Reliability
, vol.43
, pp. 1117-1123
-
-
Tee, T.Y.1
-
12
-
-
0031362276
-
Is the Maximum Acceleration an Adequate Criterion of the Dynamic Strength of a Structure Element in an Electronic Product?
-
Suhir, E., "Is the Maximum Acceleration an Adequate Criterion of the Dynamic Strength of a Structure Element in an Electronic Product?", IEEE Trans-Components, Packaging, and Manufacturing Technology: A, Vol. 20, No.4(1997), pp.513-517.
-
(1997)
IEEE Trans-Components, Packaging, and Manufacturing Technology: A
, vol.20
, Issue.4
, pp. 513-517
-
-
Suhir, E.1
-
13
-
-
24644461682
-
Drop Test Reliability of Wafer Level Chip Scale Packages
-
May 31-June 3, Florida, pp
-
th Electronic Components and Technology Conf, May 31-June 3, 2005, Florida, pp. 637-643.
-
(2005)
th Electronic Components and Technology Conf
, pp. 637-643
-
-
Alajoki, M.1
Nguyen, L.2
Kivilahti, J.3
|