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Volumn , Issue , 2007, Pages 528-535

Comprehensive modeling of stress-strain behavior for lead-free solder joints under board-level drop impact loading condition

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; RELIABILITY ANALYSIS; STRAIN; STRESS ANALYSIS;

EID: 35348904977     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373847     Document Type: Conference Paper
Times cited : (24)

References (13)
  • 2
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    • th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 356-363.
  • 3
    • 33845588217 scopus 로고    scopus 로고
    • Drop Impact Analysis of Sn-Ag-Cu Solder Joints Using Dynamic High-Strain Rate Plastic Strain as the Impact Damage Driving Force
    • May 30-June 2, San Diego, California, pp
    • th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 49-54.
    • (2006) th Electronic Components and Technology Conf , pp. 49-54
    • Pang, J.H.L.1    Che, F.X.2
  • 4
    • 33646383102 scopus 로고    scopus 로고
    • Chong, Desmond Y.R., Che, F.X, et al, Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages, Microelectronics Reliability, 46/7 (2006) pp. 1160-1171.
    • Chong, Desmond Y.R., Che, F.X, et al, "Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages", Microelectronics Reliability, Vol 46/7 (2006) pp. 1160-1171.
  • 5
    • 33845567770 scopus 로고    scopus 로고
    • Modeling Board-Level Four-Point Bend Fatigue and Impact Drop Tests
    • May 30-June 2, San Diego, California, pp
    • th Electronic Components and Technology Conf, May 30-June 2, 2006, San Diego, California, pp. 443-448.
    • (2006) th Electronic Components and Technology Conf , pp. 443-448
    • Che, F.X.1
  • 6
    • 2942740958 scopus 로고    scopus 로고
    • Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test
    • Tee, T.Y., Ng, H.S., Lim, C.T., et al, "Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test", Microelectronics Reliability, Vol. 44, (2004), pp. 1131-1142.
    • (2004) Microelectronics Reliability , vol.44 , pp. 1131-1142
    • Tee, T.Y.1    Ng, H.S.2    Lim, C.T.3
  • 7
    • 4444374713 scopus 로고    scopus 로고
    • Flip Chip on Board: Assessment of Reliability in Cellular Phone Application
    • Sillanpää, M, Okura J.H., "Flip Chip on Board: Assessment of Reliability in Cellular Phone Application", IEEE Trans-Components and Packaging Technologies, Vol. 27, No.3(2004), pp.461-467.
    • (2004) IEEE Trans-Components and Packaging Technologies , vol.27 , Issue.3 , pp. 461-467
    • Sillanpää, M.1    Okura, J.H.2
  • 8
    • 0038351732 scopus 로고    scopus 로고
    • Modeling Technique for Reliability Assessment of Portable Electronic Product Subjected to Drop Impact Loads
    • New Orleans
    • rd Electronic Components and Technology Conf, New Orleans, 2003, pp. 100-104.
    • (2003) rd Electronic Components and Technology Conf , pp. 100-104
    • Zhu, L.P.1
  • 9
    • 24644473712 scopus 로고    scopus 로고
    • A Methodology for Drop Performance Prediction and Application for Design Optimization of Chip Scale Packages
    • Lake Buena Vista, FL, June
    • th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, pp. 472-479.
    • (2005) th Electronic Components and Technology Conf , pp. 472-479
    • Syed, A.1
  • 11
    • 0038451605 scopus 로고    scopus 로고
    • Board Level Solder Joint Reliability Modeling and Testing of TFBGA Packages for Telecommunication Applications
    • Tee, T.Y., et al, "Board Level Solder Joint Reliability Modeling and Testing of TFBGA Packages for Telecommunication Applications", Microelectronics Reliability, 43 (2003), pp. 1117-1123..
    • (2003) Microelectronics Reliability , vol.43 , pp. 1117-1123
    • Tee, T.Y.1
  • 12
    • 0031362276 scopus 로고    scopus 로고
    • Is the Maximum Acceleration an Adequate Criterion of the Dynamic Strength of a Structure Element in an Electronic Product?
    • Suhir, E., "Is the Maximum Acceleration an Adequate Criterion of the Dynamic Strength of a Structure Element in an Electronic Product?", IEEE Trans-Components, Packaging, and Manufacturing Technology: A, Vol. 20, No.4(1997), pp.513-517.
    • (1997) IEEE Trans-Components, Packaging, and Manufacturing Technology: A , vol.20 , Issue.4 , pp. 513-517
    • Suhir, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.