Characterization of a multilayer Laue lens with imperfections

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 126-128

  Yan, H ^a,b   Kang, H C ^a,c   Maser, J ^a,b   Macrander, A T ^b   Kewish, C M ^b   Liu, C ^b   Conley, R ^b   Stephenson, G B ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Characterization; Imperfection; Multilayer Laue lens; X ray focusing optics

Indexed keywords

DEFECTS; FOCUSING; PHOTONS; POLYNOMIALS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

MULTILAYER LAUE LENS; X RAY FOCUSING OPTICS; ZONE PLATE LAW;

LENSES;

EID: 35348871268     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.080     Document Type: Article

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