Misfit reduction by a spinel layer formed during the epitaxial growth of ZnO on sapphire using a MgO buffer layer

Journal of Crystal Growth

Volumn 308, Issue 2, 2007, Pages 314-320

  Bakin, A ^a   Kioseoglou, J ^b   Pecz, B ^c   El Shaer, A ^a   Mofor, A C ^a   Stoemenos, J ^b   Waag, A ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

A1. Interfaces; A1. Transmission electron microscopy; A3. Molecular beam epitaxy; B2. Semiconducting II VI materials

Indexed keywords

ANNEALING; BUFFER LAYERS; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; MAGNESIA; MOLECULAR BEAM EPITAXY; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

DEPOSITION TEMPERATURE; SEMICONDUCTING II-VI MATERIALS; SPINEL INTERMEDIATE LAYER; SUBSTRATE FORMING;

OXIDE FILMS;

EID: 35348865516     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.08.012     Document Type: Article

References (21)

1. Bagnall D.M., Chen Y.F., Zhu Z., Yao T., Koyama S., Shen M.Y., and Goto T. Appl. Phys. Lett. 70 (1997) 2230
2. Kawasaki M., Ohtomo A., Ohkubo I., Koinuma H., Tang Z.K., Yu P., Wong G.K.L., Zhang B.P., and Segawa Y. Mater. Sci. Eng. B 56 (1998) 239
3. Queisser H.J., and Haller E.E. Science 281 (1998) 945
4. Look D.C. Mater. Sci. Eng. B 80 (2001) 383
5. Look D.C., Reynolds D.C., Hemsky J.W., Jones R.L., and Sizelove J.R. Appl. Phys. Lett. 75 (1999) 811
6. El-Shaer A., Bakin A., Che Mofor A., Bläsing J., Krost A., Stoimenos J., Pecz B., Kreye M., and Waag A. J. Appl. Phys. A: Mater. Sci. Process. 88 (2007) 57
7. Chen Y., Ko H.-J., Hong S.-K., Yao T., and Segawa Y. J. Crystal Growth 214/215 (2000) 87
8. Chen Y., Hong S.-K., Ko H.-J., Kirshner V., Wenisch H., Yao T., Inaba K., and Segawa Y. Appl. Phys. Lett. 78 (2001) 3352
9. Kato H., Miyamoto K., Sano M., and Yao T. Appl. Phys. Lett. 84 (2004) 4562
10. Zeng Z.Q., Liu Y.Z., Yuan H.T., Mei Z.X., Du X.L., Jia J.F., Xue Q.K., and Zhang Z. Appl. Phys. Lett. 90 (2007) 081911
11. El-Shaer A., Che Mofor A., Bakin A., Kreye M., and Waag A. Superlattices Microstruct. 38 (2005) 265
12. Bakin A., El-Shaer A., Che Mofor A., Kreye M., Waag A., Bertram F., Christen J., and Stoimenos J. J. Crystal Growth 287 (2006) 7
13. Pecz B., El-Shaer A., Bakin A., Che Mofor A., Waag A., and Stoemenos J. J. Appl. Phys. 100 (2006) 103506
14. Hirsch P.B., Howie A., Nicholson R.B., and Pashley D.W. Electron Microscopy of Thin Crystals (1965), Butterworths, London
15. Stadelmann P.A. Ultramicroscopy 21 (1987) 131
16. Comer J.J., Tombes N.C., and Fitzgerald J.F. J. Am. Ceram. Soc. 49 (1966) 237
17. Navias L. J. Am. Ceram. Soc. 44 (1961) 434
18. Rossi R.C., and Fulrath R.M. J. Am. Ceram. Soc. 64 (1963) 368
19. Carter R.E. J. Am. Ceram. Soc. 44 (1961) 116
20. Sieber H., Hesse D., Panb X., Senz S., and Heydenreich J. Z. Anorg. Allg. Chem. 622 (1996) 1658
21. Zeng Z.Q., Liu Y.Z., Yuan H.T., Mei Z.X., Dua X.L., Jia F., Xueb Q.K., and Zhang Z. Appl. Phys. Lett. 90 (2007) 081911