A comprehensive review of accelerated degradation testing

Binggong Xuebao/Acta Armamentarii

Volumn 28, Issue 8, 2007, Pages 1002-1007

  Deng, Ai Min ^a,b   Chen, Xun ^a   Zhang, Chun Hua ^a   Wang, Ya Shun ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b EAAF Equipment Institute of Land Based Air Defence   (China)

Author keywords

Accelerated degradation testing; Accelerated life testing; Accelerated testing; Aerospace system engineering; Degradation model; Reliability

Indexed keywords

DATA REDUCTION; OPTIMIZATION; RELIABILITY;

ACCELERATED DEGRADATION TESTING; ACCELERATED LIFE TESTING; ACCELERATED TESTING; AEROSPACE SYSTEM ENGINEERING; DEGRADATION MODEL;

SYSTEMS ENGINEERING;

EID: 35248891465     PISSN: 10001093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (43)

1. Yurkowsky W, Schafter R E, Finkelstein J M. Accelerated testing technology, RADC-TR-67-420 [R]. Rome Air Development Center, 1967: 1-2.
2. Criscimagna N H. Accelerated testing [G] //Selected Topics in Assurance Related Technologies, RAC, 1999, 6 (4): 1-6.
3. Nelson W. Accelerated testing: Statistical methods, test plans, and data analysis [M]. New York: John Wiley Press, 1990.
4. Elsayed E A, Argon Cheng-Kang. Recent research and current issues in accelerated testing [C]. IEEE International Conference on Systems, Man, and Cybernetics, San Diego, California, US, 1998, 5: 4704-4709.
5. Meeker W Q, Escobar L A, Lu J C. Accelerated degradation tests: Modeling and analysis [J]. Technometrics, 1998, 40 (2): 89-99.
6. Yukihisa Zero. The basic of failure physics [M]. YANG Jia-keng, translated. Beijing: Science Press, 1982. (in Chinese)
7. Nelson W B, Meeker W Q. Theory for optimum censored accelerated life tests for Weibull and extreme value distributions [J]. Technometrics, 1978, 20 (2): 171-177.
8. Nelson W B. Accelerated life testing-step-stress models and data analysis [J]. IEEE Transactions on Reliability, 1980, 29 (2): 103-108.
9. GE Guang-ping, MA Hai-xun, HE You-hua. Data analysis from accelerated life test using step stress and weibull distribution [C]. Beijing: ICRMS, 1994: 39-41.
10. MAO Shi-song, WANG Ling-ling. Accelerated life test [M]. Beijing: Science Press, 2000: 6-30. (in Chinese)
11. ZHANG Chun-hua, WEN Xi-sen, CYEN Xun. Accelerated life test: An introductory review [J]. Acta Armamentarii, 2004, 25 (4): 484-490. (in Chinese)
12. ZHANG Chun-hua, CHEN Xun, WEN Xi-sen. Step-down-stress accelerated life testing-methodology [J]. Acta Armamentarii, 2005, 26 (4): 661-665. (in Chinese)
13. ZHANG Chun-hua, CHEN Xun, WEN Xi-sen. Step-down-stress accelerated life testing-statistical analysis [J]. Acta Armamentarii, 2005, 26 (4): 666-669. (in Chinese)
14. LIN Zheng-ning, FEI He-liang. A nonparametric approach to progressive stress accelerated life testing [J]. IEEE Transactions on Reliability, 1991, 40 (2): 173-176.
15. YANG Guang-bin. Optimum constant-stress accelerated life test plans [J]. IEEE Transactions on Reliability, 1994, 43 (4): 575-581.
16. Khamis I H, Higgins J J. Optimum 3-step step-stress tests [J]. IEEE Transactions on Reliability, 1996, 45 (2): 341-345.
17. ZHANG Ping-ping. Study and application of accelerated life test for aviation products [J]. Journal of Beijing University of Aeronautics and Astronautics, 1995, 21 (4): 124-129. (in Chinese)
18. Meek W Q. Limited failure population life tests: Application to integrated circuit reliability [J]. Technometrics, 1987, 29 (1): 51-65.
19. CHEN Xun, TAO Jun-yong, ZHANG Chun-hua. Reliability enhancement testing and accelerated life testing: An introductory review [J]. Journal of National University of Defense Technology, 2002, 24 (2): 29-32. (in Chinese)
20. McLinn J A. New analysis methods of multilevel accelerated life tests [J]. IEEE Proceedings of Annual Reliability and Maintainability Symposium, 1999: 38-42.
21. Meeker W Q, Hamada M. Statistical tools for the rapid development and evaluation of high-reliability products [J]. IEEE Transactions on Reliability, 1995, 44 (4): 187-198.
22. Lu J C, Park J, Yang Q. Statistical inference of a time-to-failure distribution derived from linear degradation data [J]. Technometrics, 1997, 39 (4): 391-400.
23. Yu H F, Tseng S T. Designing a screening experiment for highly reliable products [J]. Naval Research Logistics, 2002, 49: 514-526.
24. Yang K, Yang G. Degradation reliability assessment using severe critical values [J]. International Journal of Reliability, Quality and Safety Engineering, 1998, 5 (1): 85-95.
25. Nelson W. Analysis of performance-degradation data from accelerated tests [J]. IEEE Transactions on Reliability, 1981, 30 (2): 149-154.
26. Carey M B, Koenig R H. Reliability assessment based on accelerated degradation: A case study [J]. IEEE Transactions on Reliability, 1991, 40 (5): 499-506.
27. Feinberg A A, Widom A. Connecting parametric aging to catastrophic failure through thermodynamics [J]. IEEE Transactions on Reliability, 1996, 45 (1): 28-33.
28. Chuang S L, Ishibashi A, et al. Kinetic model for degradation of light emitting diodes [J]. IEEE Journal of Quantum Electronics, 1997, 33 (6): 970-979.
29. Meeker W Q, Escobar L A. Statistical methods for reliability data [M]. New York: John Wiley Press, 1998.
30. Lu J C, Meeker W Q. Using degradation measures to estimate a time-to-failure distribution [J]. Technometrics, 1993, 35 (2): 161-174.
31. Stock D, Vesely W E, et al. Development and application of degradation modeling to define maintenance practices [R]. NUREG/CR-5967, 1994.
32. Yang G B, Yang K. Accelerated degradation tests with tightened critical values [J]. IEEE Transactions on Reliability, 2002, 51 (4): 463-468.
33. Tang L C, Chang D S. Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies [J]. IEEE Transactions on Reliability, 1995, 44 (4): 562-566.
34. Tseng S T, Hamada M S, Chiao C H. Using degradation data from a fractional factorial experiment to improve fluorescent lamp reliability [J]. Journal of Quality Technology, 1995, 27 (4): 363-369.
35. Shiau J J H, Lin H H. Analyzing accelerated degradation data by nonparametric regression [J]. IEEE Transactions on Reliability, 1999, 48 (2): 149-158.
36. Boulanger M, Escobar L A. Experimental design for a class of accelerated degradation tests [J]. Technometrics, 1994, 36 (4): 260-272.
37. Loon-Ching Tang, Guiyu Yang, Min Xie. Planning of step-stress accelerated degradation test [C]. Proceedings Annual Reliability and Maintainability Symposium, 2004: 287-292.
38. Yu Hong-fwu, Tseng Sheng-tsaing. On-line procedure for terminating an accelerated degradation test [J]. Statistical Sinica 1998, 8: 207-220.
39. Tseng Sheng-tsaing, Yu hong-fwu. A termination rule for degradation experiments [J]. IEEE Transactions on Reliability, 1997, 46 (1): 130-133.
40. LU Wei-li, WANG Chang-hua. Method on evaluating product stock reliability using accelerated aging testing [J]. Electronic Product Reliability and Environmental Testing, 1998, 3: 3-10. (in Chinese)
41. LI Hai-chang, GUO Fang-jun, LEI Bin. Accelerated aging test of piezoelectric ceramics for a fuze [J]. Journal of Ordnance Engineering College, 1997, 9 (4): 33-38. (in Chinese)
42. SU De-qing. Research report of accelerated life test parameter degradation model of low noise microwave GaAsFET [R]. China Electronics Standardization Institute, 1992. (in Chinese)
43. Ministry of Machinery Industry Standard. JB3481-85, JB3482-83 [S]. Guilin: Guilin Electrical Apparatus Research Institute, 1985. (in Chinese)