Designing a screening experiment for highly reliable products

Naval Research Logistics

Volumn 49, Issue 5, 2002, Pages 514-526

  Yu, Hong Fwu ^a   Tseng, Sheng Tsaing ^b  

^a I SHOU UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Degradation tests; Inspection frequency; Optimal test plan; Resolution III design; Termination time; Wiener process

Indexed keywords

DECISION MAKING; DEGRADATION; FLUORESCENT LAMPS; PROBABILITY; PRODUCT DESIGN; RELIABILITY;

ACCELERATED DEGRADATION TESTS (ADT);

PRODUCT DEVELOPMENT;

EID: 0036684579     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/nav.10024     Document Type: Article

References (11)

1. Experimental design for a class of accelerated degradation tests
2. Robust reliability for light emitting diodes using degradation measurements
3. Models for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution
4. Using degradation data from a fractional factorial experiment to improve fluorescent lamp reliability
5. A termination rule for degradation experiments
6. Designing a degradation experiment