Recent research and current issues in accelerated testing

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 5, Issue , 1998, Pages 4704-4709

  Elsayed, E A ^a   Chen, Argon C K ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PARAMETER ESTIMATION; SERVICE LIFE;

ACCELERATED TESTING;

RELIABILITY THEORY;

EID: 0032308434     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)