Measuring elastoplastic properties of thin films on an elastic substrate using sharp indentation

Acta Materialia

Volumn 55, Issue 18, 2007, Pages 6260-6274

  Zhao, Manhong ^a   Chen, Xi ^a   Xiang, Yong ^b   Vlassak, Joost J ^b   Lee, Dongyun ^c   Ogasawara, Nagahisa ^d   Chiba, Norimasa ^d   Gan, Yong X ^e  

^a Columbia University ^*  (United States)

^b HARVARD UNIVERSITY   (United States)

^c Korea Institute of Science and Technology   (South Korea)

^d NATIONAL DEFENSE ACADEMY   (Japan)

^e Albert Nerken School of Engineering   (United States)

Author keywords

Finite element analysis; Microindentation; Plastic deformation

Indexed keywords

ALGORITHMS; ELASTOPLASTICITY; ERROR ANALYSIS; FINITE ELEMENT METHOD; PLASTIC DEFORMATION; SUBSTRATES;

ELASTIC SUBSTRATES; ERROR SENSITIVITY; INDENTATION ANALYSIS; REVERSE ANALYSIS ALGORITHMS;

THIN FILMS;

EID: 35048881432     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.07.045     Document Type: Article

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