-
3
-
-
0032563309
-
-
J. K. Gimzewski, C. Joachim, R. R. Schlittler, V. Langlais, H. Tang, and I. Johannsen, Science 281, 531 (1998).
-
(1998)
Science
, vol.281
, pp. 531
-
-
Gimzewski, J.K.1
Joachim, C.2
Schlittler, R.R.3
Langlais, V.4
Tang, H.5
Johannsen, I.6
-
5
-
-
0000031946
-
-
C. Joachim, J. K. Gimzewski, R. R. Schlittler, and C. Chavy, Phys. Rev. Lett. 74, 2102 (1995).
-
(1995)
Phys. Rev. Lett.
, vol.74
, pp. 2102
-
-
Joachim, C.1
Gimzewski, J.K.2
Schlittler, R.R.3
Chavy, C.4
-
6
-
-
0030909823
-
-
A. Yazdani, B. A. Jones, C. P. Lutz, M. F. Crommie, and D. M. Eigler, Science 275, 1767 (1997).
-
(1997)
Science
, vol.275
, pp. 1767
-
-
Yazdani, A.1
Jones, B.A.2
Lutz, C.P.3
Crommie, M.F.4
Eigler, D.M.5
-
7
-
-
0032500145
-
-
E. Scheer, N. Agrait, J. C. Cuevas, A. Levy Yeyati, B. Ludoph, A. Martin-Rodero, G. R. Bollinger, J. M. v. Ruitenbeek, and C. Urbina, Nature (London) 394, 154 (1998).
-
(1998)
Nature (London)
, vol.394
, pp. 154
-
-
Scheer, E.1
Agrait, N.2
Cuevas, J.C.3
Levy Yeyati, A.4
Ludoph, B.5
Martin-Rodero, A.6
Bollinger, G.R.7
Ruitenbeek, J.M.V.8
Urbina, C.9
-
8
-
-
0001769713
-
-
M. P. O'Neil, M. P. Niemczyk, W. A. Svec, D. Gosztola, G. L. Gaines III, and M. R. Wasielewski, Science 257, 63 (1992).
-
(1992)
Science
, vol.257
, pp. 63
-
-
O'Neil, M.P.1
Niemczyk, M.P.2
Svec, W.A.3
Gosztola, D.4
Gaines G.L. III5
Wasielewski, M.R.6
-
9
-
-
28344451958
-
-
A. Aviram and M. A. Ratner, Chem. Phys. Lett. 29, 277 (1974); M. Pomerantz, A. Aviram, R. A. McCorkle, L. Li, and A. G. Schrott, Science 255, 1115 (1992).
-
(1974)
Chem. Phys. Lett.
, vol.29
, pp. 277
-
-
Aviram, A.1
Ratner, M.A.2
-
10
-
-
0001766111
-
-
A. Aviram and M. A. Ratner, Chem. Phys. Lett. 29, 277 (1974); M. Pomerantz, A. Aviram, R. A. McCorkle, L. Li, and A. G. Schrott, Science 255, 1115 (1992).
-
(1992)
Science
, vol.255
, pp. 1115
-
-
Pomerantz, M.1
Aviram, A.2
McCorkle, R.A.3
Li, L.4
Schrott, A.G.5
-
12
-
-
0031557006
-
-
C. Joachim and J. K. Gimzewski, Chem. Phys. Lett. 265, 353 (1997); S. J. Tans, A. R. M. Verschuren, and C. Dekker, Nature (London) 393, 49 (1998).
-
(1997)
Chem. Phys. Lett.
, vol.265
, pp. 353
-
-
Joachim, C.1
Gimzewski, J.K.2
-
13
-
-
0032492884
-
-
C. Joachim and J. K. Gimzewski, Chem. Phys. Lett. 265, 353 (1997); S. J. Tans, A. R. M. Verschuren, and C. Dekker, Nature (London) 393, 49 (1998).
-
(1998)
Nature (London)
, vol.393
, pp. 49
-
-
Tans, S.J.1
Verschuren, A.R.M.2
Dekker, C.3
-
14
-
-
0011715296
-
-
For a very recent overview see J. Gimzewski, Phys. World 11, 29 (1998).
-
(1998)
Phys. World
, vol.11
, pp. 29
-
-
Gimzewski, J.1
-
15
-
-
1842413643
-
-
M. A. Reed, C. Zhou, C. J. Muller, T. P. Burgin, and J. M. Tour, Science 278, 252 (1997).
-
(1997)
Science
, vol.278
, pp. 252
-
-
Reed, M.A.1
Zhou, C.2
Muller, C.J.3
Burgin, T.P.4
Tour, J.M.5
-
16
-
-
0003517825
-
-
Nato ASI Series, edited by L. L. Sohn, L. P. Kouwenhoven, and G. Schön (Kluwer, Dordrecht), and references therein
-
See for instance L. L. Sohn, C. T. Black, M. Eriksson, M. Crommie, and H. Hess, in Mesoscopic Electron Transport, Nato ASI Series, edited by L. L. Sohn, L. P. Kouwenhoven, and G. Schön (Kluwer, Dordrecht, 1997), and references therein.
-
(1997)
Mesoscopic Electron Transport
-
-
Sohn, L.L.1
Black, C.T.2
Eriksson, M.3
Crommie, M.4
Hess, H.5
-
17
-
-
0001143590
-
-
Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
-
(1995)
Science
, vol.270
, pp. 1639
-
-
Snow, E.S.1
Campbell, P.M.2
-
18
-
-
0000252777
-
-
Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 275
-
-
Nakamura, Y.1
Klein, D.L.2
Tsai, J.S.3
-
19
-
-
0000499978
-
-
Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2173
-
-
Schmidt, T.1
Martel, R.2
Sandstrom, R.L.3
Avouris, P.4
-
22
-
-
0042448204
-
-
edited by J. A. Stroscio and W. J. Kaiser Academic, San Diego
-
Y. Kuk, in Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic, San Diego, 1993), p. 281.
-
(1993)
Scanning Tunneling Microscopy
, pp. 281
-
-
Kuk, Y.1
-
23
-
-
21544476973
-
-
D. L. Klein, P. L. McEuen, J. E. Bowen Katari, R. Roth, and A. P. Alivisatos, Appl. Phys. Lett. 68, 2574 (1996); A. Bezryadin and C. Dekker, J. Vac. Sci. Technol. B 15, 793 (1997); A. Bezryadin, C. Dekker, and G. Schmid, Appl. Phys. Lett. 71, 1273 (1997).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2574
-
-
Klein, D.L.1
McEuen, P.L.2
Bowen Katari, J.E.3
Roth, R.4
Alivisatos, A.P.5
-
24
-
-
0000920536
-
-
D. L. Klein, P. L. McEuen, J. E. Bowen Katari, R. Roth, and A. P. Alivisatos, Appl. Phys. Lett. 68, 2574 (1996); A. Bezryadin and C. Dekker, J. Vac. Sci. Technol. B 15, 793 (1997); A. Bezryadin, C. Dekker, and G. Schmid, Appl. Phys. Lett. 71, 1273 (1997).
-
(1997)
J. Vac. Sci. Technol. B
, vol.15
, pp. 793
-
-
Bezryadin, A.1
Dekker, C.2
-
25
-
-
0031238258
-
-
D. L. Klein, P. L. McEuen, J. E. Bowen Katari, R. Roth, and A. P. Alivisatos, Appl. Phys. Lett. 68, 2574 (1996); A. Bezryadin and C. Dekker, J. Vac. Sci. Technol. B 15, 793 (1997); A. Bezryadin, C. Dekker, and G. Schmid, Appl. Phys. Lett. 71, 1273 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 1273
-
-
Bezryadin, A.1
Dekker, C.2
Schmid, G.3
|