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Volumn 74, Issue 14, 1999, Pages 2084-2086

Controlled fabrication of metallic electrodes with atomic separation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000516596     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123765     Document Type: Article
Times cited : (305)

References (25)
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    • Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
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  • 18
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    • Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
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    • Nakamura, Y.1    Klein, D.L.2    Tsai, J.S.3
  • 19
    • 0000499978 scopus 로고    scopus 로고
    • Similar in situ monitoring of the electrical properties of a device to control its fabrication has been used previously, see for instance E. S. Snow and P. M. Campbell, Science 270, 1639 (1995); Y. Nakamura, D. L. Klein, and J. S. Tsai, Appl. Phys. Lett. 68, 275 (1996); T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, ibid. 73, 2173 (1998).
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    • D. L. Klein, P. L. McEuen, J. E. Bowen Katari, R. Roth, and A. P. Alivisatos, Appl. Phys. Lett. 68, 2574 (1996); A. Bezryadin and C. Dekker, J. Vac. Sci. Technol. B 15, 793 (1997); A. Bezryadin, C. Dekker, and G. Schmid, Appl. Phys. Lett. 71, 1273 (1997).
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    • D. L. Klein, P. L. McEuen, J. E. Bowen Katari, R. Roth, and A. P. Alivisatos, Appl. Phys. Lett. 68, 2574 (1996); A. Bezryadin and C. Dekker, J. Vac. Sci. Technol. B 15, 793 (1997); A. Bezryadin, C. Dekker, and G. Schmid, Appl. Phys. Lett. 71, 1273 (1997).
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