Single-element elliptical hard x-ray micro-optics

Optics Express

Volumn 11, Issue 8, 2003, Pages 919-926

  Evans Lutterodt, Kenneth ^a   Ablett, James M ^a   Stein, Aaron ^a   Kao, Chi Chang ^a   Tennant, Donald M ^b   Klemens, Fred ^b   Taylor, Ashley ^b   Jacobsen, Chris ^c   Gammel, Peter L ^d   Huggins, Harold ^d   Ustin, Scott ^d   Bogart, Greg ^d   Ocola, Leo ^d  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b New Jersey Nanotechnology Consortium   (United States)

^c STONY BROOK UNIVERSITY   (United States)

^d AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; FLUORESCENCE; GRAIN BOUNDARIES; LIGHT ABSORPTION; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; PHASE SHIFT; PHOTONS; RAY TRACING; REACTIVE ION ETCHING; REFRACTIVE INDEX; SILICON; SINGLE CRYSTALS; SYNCHROTRON RADIATION;

ABSORPTION INDEX; DEMAGNIFICATION; RAY-TRACING SIMULATIONS; X-RAY PHOTONS;

X RAY OPTICS;

EID: 2942741125     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.11.000919     Document Type: Article

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