Preparation of ferrite-coated magnetic force microscopy cantilevers

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 25, Issue 5, 2007, Pages 1679-1683

  Kirsch, M ^a   Koblischka, M R ^a   Wei, J D ^a   Hartmann, U ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FORCE MICROSCOPY; MICROMACHINING; OPTIMIZATION; OXIDE FILMS; SPUTTERING; THICKNESS MEASUREMENT;

CANTILEVER COATINGS;

FERRITES;

EID: 34648815813     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2782471     Document Type: Article

References (24)

1. J. Smit and H. P. J. Wijn, Ferrite (Philips Technical Library, Eindhoven, 1960).
2. S. Krupicka, Physik der Ferrite und der Verwandten Magnetischen Oxide (Vieweg, Braunschweig, 1973).
3. A. Goldman, Modern Ferrite Technology (Van Nostrand, New York, 1990).
4. N. Matsushita, C. P. Chong, T. Mizutani, and M. Abe, J. Appl. Phys. 91, 7376 (2002).
5. H. K. Wickramasinghe, Acta Mater. 48, 347 (2000).
6. U. Hartmann, Annu. Rev. Mater. Sci. 29, 53 (1999).
7. G. D. Skidmore and E. Dan Dahlberg, Appl. Phys. Lett. 71, 3293 (1997).
8. M. R. Koblischka and U. Hartmann, Ultramicroscopy 97, 103 (2003).
9. M. R. Koblischka, U. Hartmann, and T. Sulzbach, J. Magn. Magn. Mater. 272-276, 2138 (2004).
10. R. Proksch, P. Neilson, S. Austvold, and J. J. Schmidt, Appl. Phys. Lett. 74, 1308 (1999).
11. M. Abe and Y. Tanaka, J. Appl. Phys. 89, 6766 (2001).
12. S. Li, S. Stokes, Y. Liu, S. Foss-Schrader, W. Zhu, and D. Palmer, J. Appl. Phys. 91, 7346 (2002).
13. M. Abe and Y. Tanaka, IEEE Trans. Magn. 38, 45 (2002).
14. M. Abe and Y. Tanaka, IEEE Trans. Magn. 40, 1708 (2004).
15. A. V. Nazarov, M. L. Plumer, and B. B. Pant, J. Appl. Phys. 97, 10N902 (2005).
16. S. Li, Science, Technology and Education of Microscopy: an Overview (Formatex, Badajoz, 2003), Vol. 1, pp. 734-741.
17. M. R. Koblischka, J. D. Wei, M. Kirsch, and U. Hartmann, Jpn. J. Appl. Phys., Part 1 45, 2238 (2006).
18. J. Gao, Y. Cui, and Z. Yang, Mater. Sci. Eng., B 110, 111 (2004).
19. A. S. Kamzin, F. Wei, Z. Yang, and X. Liu, Phys. Solid State 44, 1635 (2002).
20. E. S. Ramakrishnan, K. D. Cornett, and G. Srinivasan, J. Appl. Phys. 81, 5162 (1997).
21. Datasheet Pointprobe cantilevers, Nanoworld Services GmbH, Erlangen, Germany.
22. S. Bals, W. Tirry, R. Guerts, Z. Q. Yang, and D. Schryvers, Microsc. Microanal. 13, 80 (2007).
23. J. Wei, M. Kirsch, M. R. Koblischka, and U. Hartmann, J. Magn. Magn. Mater. 316, 206 (2007).
24. M. R. Koblischka, M. Kirsch, J. Wei, and U. Hartmann, J. Magn. Magn. Mater. 316, e666 (2007).