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Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 6766-6768

High frequency write head measurement with the phase detection magnetic force microscope

(2) Abe, M a Tanaka, Y a

a TOSHIBA CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356519 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1359232 Document Type: Article

Times cited : (24)

References (13)

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13
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- to be submitted
- M. Abe, and Y. Tanaka (to be submitted).
- Abe, M.¹ Tanaka, Y.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.