A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

IEEE Transactions on Magnetics

Volumn 38, Issue 1 I, 2002, Pages 45-49

  Abe, Masayuki ^b   Tanaka, Yoichiro ^a,b  

^a IEEE

^b TOSHIBA CORPORATION   (Japan)

Author keywords

Frequency characteristics; High frequency measurement; Magnetic force microscope; Overwrite; Write head

Indexed keywords

AMPLIFIERS (ELECTRONIC); FREQUENCY MODULATION; HARD DISK STORAGE; MAGNETIC FIELD EFFECTS; MAGNETIC RECORDING; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES;

HIGH-FREQUENCY MAGNETIC FORCE MICROSCOPES (HF-MFM);

MAGNETIC HEADS;

EID: 0036238364     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.988909     Document Type: Article

References (11)

1. Measuring the gigahertz response of recording heads with the magnetic force microscope
2. High frequency write head measurement with the phase detection magnetic force microscope
3. A three-dimensional measuring method for magnetic stray fields
4. Time-resolved measurement of micro-magnetic field by stroboscopic electron beam tomography
5. High frequency response of thin film heads by scanning Kerr effect microscopy
6. High frequency magnetization response observed at the air-bearing surfaces of thin film heads
7. Picosecond time-resolved magnetization dynamics of thin-film heads
8. Current dependence of the magnetization rise time in thin film heads
9. High frequency write head measurement with the phase detection magnetic force microscope
10. Magnetic fields of finite track width heads