High frequency magnetic force microscopy-imaging of harddisk write heads

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 2238-2241

  Koblischka, Michael R ^a   Wei, Jian Dong ^a   Kirsch, Michael ^a   Hartmann, Uwe ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Advanced cantilevers; Ferrites; Harddisk write head; High frequency response; Magnetic force microscopy

Indexed keywords

ASPECT RATIO; COATING TECHNIQUES; FERRITES; IMAGING SYSTEMS; MAGNETIC HEADS; OPTICAL RESOLVING POWER;

HARDDISK WRITE HEAD; MAGNETIC COATING; MAGNETIC FORCE MICROSCOPY; SPATIAL RESOLUTION;

HARD DISK STORAGE;

EID: 33645548839     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.2238     Document Type: Article

References (21)

1. J. Matsuda, K. Aoyagi, Y. Kondoh, M. Iizuka and K. Mukasa: IEEE Trans. Magn. 26 (1990) 2061.
2. H. Shinada, H. Suzuki, S. Sakaki, H. Todokoro, H. Takano and K. Shiiki: IEEE Trans. Magn. 28 (1992) 3117.
3. B. W. Corb: IEEE Trans. Magn. 24 (1988) 2838.
4. F. H. Liu, H. Tong and L. Miloslavsky: IEEE Trans. Magn. 32 (1996) 3536.
5. M. R. Freeman and J. F. Smyth: J. Appl. Phys. 81 (1997) 4516.
6. M. R. Freeman, A. Y. Elezzabi and J. A. H. Stotz: J. Appl. Phys. 81 (1997) 4516
7. R. Proksch, P. Neilson, S. Austvold and J. J. Schmidt: Appl. Phys. Lett. 74 (1999) 1308.
8. C. X. Qian, H. C. Tong, F. H. Liu, X. Shi, S. Dey, R. B. Proksch, P. Nielson and H. E. Hachfeld; IEEE Trans. Magn. 35 (1999) 2625.
9. M. Abe and Y. Tanaka: J. Appl. Phys. 89 (2001) 6766.
10. M. Abe and Y. Tanaka: IEEE Trans. Magn. 38 (2002) 45.
11. M. Abe and Y. Tanaka: IEEE Trans. Magn. 40 (2004) 1708.
12. S. Li, S. Stokes, Y. Liu, S. Foss-Schroder, W. Zhu and D. Palmer: J. Appl. Phys. 91 (2002) 7346.
13. M. R. Koblischka, U. Hartmann and T. Sulzbach: Thin Solid Films 428 (2003) 93.
14. M. R. Koblischka, U. Hartmann and T. Sulzbach: J. Magn. Magn. Mater. 272-276 (2004) 2138.
15. Seagate Inc. harddisk write head data sheet.
16. D. Rugar, H. J. Mamin, P. Guethner, J. E. Lambert, J. E. Stern, I. McFayden and T. Yogi: J. Appl. Phys. 68 (1990) 1169.
17. D. Sarid: Scanning Probe Microscopy (Oxford University Press, New York, 1991).
18. G. D. Skidmore and E. Dan Dahlberg: Appl. Phys. Lett. 71 (1997) 3293.
19. A. Goldman: Modern Ferrite Technology (Van Nostrand, New York, 1990).
20. R. C. Pullar and A. K. Bhattacharya: Mater. Res. Bull. 36 (2001) 1531.
21. N. Wakiya, K. Shinozaki and N. Mizutani: Key Eng. Mater. 269 (2004) 245.