Measuring the gigahertz response of recording heads with the magnetic force microscope

Applied Physics Letters

Volumn 74, Issue 9, 1999, Pages 1308-1310

  Proksch, Roger ^a   Neilson, Peter ^a   Austvold, Shane ^b   Schmidt, J J ^c  

^a Digital Instruments   (United States)

^b ST OLAF COLLEGE   (United States)

^c UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; FREQUENCY MODULATION; FREQUENCY RESPONSE; MAGNETIC RECORDING; MICROSCOPES; NUMERICAL METHODS; PHASE SHIFT; RESISTORS; SILICON;

MAGNETIC FORCE MICROSCOPE; RECORDING HEADS; SILICON CANTILEVERS; SPATIALLY DEPENDENT RESPONSE;

MAGNETIC HEADS;

EID: 0033089554     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123533     Document Type: Article

References (11)

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