Determination of intrinsic spectra from frontside & backside photon emission spectroscopy

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 620-621

  Tan, S L ^a   Toh, K H ^a   Chan, D S H ^a   Phang, J C H ^a   Chua, C M ^b   Koh, L S ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SEMICAPS Corporation   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34548723920     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369980     Document Type: Conference Paper

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