Analysis of near-IR photon emissions from 50-nm n- and p-channel Si MOSFETs

IEEE Transactions on Electron Devices

Volumn 52, Issue 6, 2005, Pages 1211-1214

  de Luna, Noel C ^a   Bailon, Michelle F ^b   Tarun, Alvarado B ^b  

^a INTEL CORPORATION   (United States)

^b Intel Technology Philippines Inc   (Philippines)

Author keywords

Emission; Silicon; Spectral analysis; Transistors

Indexed keywords

COMPUTER SIMULATION; HOT CARRIERS; LIGHT EMISSION; MATHEMATICAL MODELS; MONTE CARLO METHODS; PHOTONS; SEMICONDUCTING SILICON;

HOT ELECTRON TRANSITIONS; PHOTON EMISSION;

MOSFET DEVICES;

EID: 21044454076     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.848112     Document Type: Article

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