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Volumn 102, Issue 5, 2007, Pages

Integration of GaAs epitaxial layer to Si-based substrate using Ge condensation and low-temperature migration enhanced epitaxy techniques

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSATION; ELECTRIC INSULATORS; EPITAXIAL GROWTH; EPITAXIAL LAYERS; GERMANIUM; LOW TEMPERATURE EFFECTS; MOSFET DEVICES; SILICON;

EID: 34548606495     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2777401     Document Type: Article
Times cited : (12)

References (20)
  • 1
    • 0003432018 scopus 로고
    • TPRC Data Series Vol. edited by Y. S.Touloukian, R. K.Kirby, R. E.Taylor, and T. Y. R.Lee (Plenum, New York
    • Thermophysical Properties of Matter, TPRC Data Series Vol. 13, edited by, Y. S. Touloukian, R. K. Kirby, R. E. Taylor, and, T. Y. R. Lee, (Plenum, New York, 1977).
    • (1977) Thermophysical Properties of Matter , vol.13
  • 16
    • 17044382706 scopus 로고    scopus 로고
    • edited by E.Kasper and K.Lyutovich (INSPEC/The Institution of Electrical Engineers, London
    • H. J. Herzog, in Properties of Silicon Germanium and SiGe:Carbon, edited by, E. Kasper, and, K. Lyutovich, (INSPEC/The Institution of Electrical Engineers, London, 2000), p. 45.
    • (2000) Properties of Silicon Germanium and SiGe:Carbon , pp. 45
    • Herzog H., J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.