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Volumn 102, Issue 4, 2007, Pages

Optical and electrical properties of 4H-SiC epitaxial layer grown with HCl addition

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; GROWTH RATE; GROWTH TEMPERATURE; LEAKAGE CURRENTS; LUMINESCENCE; OPTICAL MICROSCOPY; SCHOTTKY BARRIER DIODES; SILICON CARBIDE;

EID: 34548400741     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767248     Document Type: Article
Times cited : (20)

References (17)
  • 1
    • 33646891147 scopus 로고    scopus 로고
    • 0018-9219 10.1109/JPROC.2002.1021562
    • A. Elasser and T. P. Chow, Proc. IEEE 0018-9219 10.1109/JPROC.2002. 1021562 90, 969 (2002).
    • (2002) Proc. IEEE , vol.90 , pp. 969
    • Elasser, A.1    Chow, T.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.