Concentration of Er3+ ions contributing to 1.5-μm emission in Si Si:Er nanolayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 8, 2007, Pages

  Vinh, N Q ^a,b   Minissale, S ^a   Vrielinck, H ^c   Gregorkiewicz, T ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^c GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34548270578     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.085339     Document Type: Article

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