Increasing manufacturing yield for wideband RF CMOS LNAs in the presence of process variations

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 801-806

  Nieuwoudt, Arthur ^a   Ragheb, Tamer ^a   Nejati, Hamid ^a   Massoud, Yehia ^a  

^a Rice University

Author keywords

[No Author keywords available]

Indexed keywords

IMPEDANCE MATCHING (ACOUSTIC); INTEGRATED CIRCUIT MANUFACTURE; LOW NOISE AMPLIFIERS; PERTURBATION TECHNIQUES; STATISTICAL PROCESS CONTROL;

DESIGN TECHNIQUES; IMPEDANCE MATCHING; PROCESS VARIATIONS;

CMOS INTEGRATED CIRCUITS;

EID: 34548133278     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.89     Document Type: Conference Paper

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