-
1
-
-
0025669255
-
Proton-induced displacement damage distributions and extremes in silicon microvolumes
-
Dec
-
P. W. Marshall, C. J. Dale, and E. A. Burke, "Proton-induced displacement damage distributions and extremes in silicon microvolumes," IEEE Trans. Nucl. Sci, vol. 37, pp. 1776-1783, Dec. 1990.
-
(1990)
IEEE Trans. Nucl. Sci
, vol.37
, pp. 1776-1783
-
-
Marshall, P.W.1
Dale, C.J.2
Burke, E.A.3
-
2
-
-
34548066525
-
-
MCNPX User's Manual, ver. Version 2.4.0, Los Alamos National Laboratory, Los Alamos, NM, Sep., 2002, LA-CP-02-408,.
-
"MCNPX User's Manual," ver. Version 2.4.0, Los Alamos National Laboratory, Los Alamos, NM, Sep., 2002, LA-CP-02-408,.
-
-
-
-
3
-
-
10044223399
-
An algorithm for computing screened Coulomb scattering in. Geant4
-
H. Mendenhall and R. A. Weiler, "An algorithm for computing screened Coulomb scattering in. Geant4," Nucl, Instrum. Methods A, vol. 227, pp. 420-430, 2005.
-
(2005)
Nucl, Instrum. Methods A
, vol.227
, pp. 420-430
-
-
Mendenhall, H.1
Weiler, R.A.2
-
4
-
-
11044232777
-
-
R. A. Weiler, M. H. Mendenhall, and D. M. Fleetwood, A screened Coulomb scattering module for displacement damage computations in Geant4, IEEE Trans. Nucl, Sci, 5.1, pp. 3669-3678, 2004.
-
R. A. Weiler, M. H. Mendenhall, and D. M. Fleetwood, "A screened Coulomb scattering module for displacement damage computations in Geant4," IEEE Trans. Nucl, Sci, vol. 5.1, pp. 3669-3678, 2004.
-
-
-
-
5
-
-
3342936820
-
Algorithms for the rapid computation of classical cross sections for screened Coulomb collisions
-
M. H. Mendenhall and R. A. Weiler, "Algorithms for the rapid computation of classical cross sections for screened Coulomb collisions," NIM B, vol. 58, pp. 11-17, 1991.
-
(1991)
NIM B
, vol.58
, pp. 11-17
-
-
Mendenhall, M.H.1
Weiler, R.A.2
-
7
-
-
34548096918
-
-
Online, Available
-
Geant4, [Online], Available: http://geant4.web.cern.ch/geant4
-
Geant4
-
-
-
8
-
-
1942486892
-
Radiation environment performance of JWST prototype FPAs
-
M. E. McKelvey, K. A. Ennico, R. R. Johnson, P. W. Marshall, R. E. McMurray Jr., C. R. McCreight, J. C. Pickel, and R. A. Reed, "Radiation environment performance of JWST prototype FPAs," in Proc. SPIE, Focal Plane Arrays for Space Telescopes, 2003, vol. 5167, pp. 223-234.
-
(2003)
Proc. SPIE, Focal Plane Arrays for Space Telescopes
, vol.5167
, pp. 223-234
-
-
McKelvey, M.E.1
Ennico, K.A.2
Johnson, R.R.3
Marshall, P.W.4
McMurray Jr., R.E.5
McCreight, C.R.6
Pickel, J.C.7
Reed, R.A.8
-
9
-
-
0000789729
-
Cobalt-60 and proton radiation effects on large format, 2-D, CCD arrays for an earth imaging application
-
G. R. Hopkinson, "Cobalt-60 and proton radiation effects on large format, 2-D, CCD arrays for an earth imaging application," IEEE Trans. Nucl. Sci, vol. 39, no. 6, pp. 2018-2025, 1992.
-
(1992)
IEEE Trans. Nucl. Sci
, vol.39
, Issue.6
, pp. 2018-2025
-
-
Hopkinson, G.R.1
-
10
-
-
0034452166
-
High-energy proton-induced dark signal in silicon charge coupled devices
-
M. S. Robbins, "High-energy proton-induced dark signal in silicon charge coupled devices," IEEE Trans. Nucl, Sci, vol. 47, no. 6, pp. 2473-2479, 2000.
-
(2000)
IEEE Trans. Nucl, Sci
, vol.47
, Issue.6
, pp. 2473-2479
-
-
Robbins, M.S.1
-
11
-
-
0036624652
-
Enhanced dark current generation in proton-irradiated CMOS active pixel sensors
-
J. Bogearts, B. Dierickx, and R. Mertens, "Enhanced dark current generation in proton-irradiated CMOS active pixel sensors," Trans. Nucl. Sci, vol. 49, no. 3, pp. 1513-1521, 2002.
-
(2002)
Trans. Nucl. Sci
, vol.49
, Issue.3
, pp. 1513-1521
-
-
Bogearts, J.1
Dierickx, B.2
Mertens, R.3
-
12
-
-
0036952413
-
Evaluation and prediction of the degradation of COTS CCD induced by displacement damage
-
R. Germanicus, S. Barde, L. Dusseau, G. Rolland, C. Barillot, F. Saigne, R. Ecoffet, P. Calvel, J. Fequet, and J. Gasiot, "Evaluation and prediction of the degradation of COTS CCD induced by displacement damage," IEEE Trans. Nucl. Sci, vol. 49, no. 6, pp. 2830-2835, 2002.
-
(2002)
IEEE Trans. Nucl. Sci
, vol.49
, Issue.6
, pp. 2830-2835
-
-
Germanicus, R.1
Barde, S.2
Dusseau, L.3
Rolland, G.4
Barillot, C.5
Saigne, F.6
Ecoffet, R.7
Calvel, P.8
Fequet, J.9
Gasiot, J.10
-
13
-
-
0028711773
-
A comparison, of Monte Carlo andanalytic treatments of displacement damage in Si microvolumes
-
C. J. Dale, L. Chen, P. J. McNulty, P. W. Marshall, and E. A. Burke, "A comparison, of Monte Carlo andanalytic treatments of displacement damage in Si microvolumes," IEEE Trans. Nucl, Sci, vol. 41, no. 6, pp. 1974-1983, 1994.
-
(1994)
IEEE Trans. Nucl, Sci
, vol.41
, Issue.6
, pp. 1974-1983
-
-
Dale, C.J.1
Chen, L.2
McNulty, P.J.3
Marshall, P.W.4
Burke, E.A.5
-
14
-
-
0024936480
-
Displacement damage extremes in silicon depletion regions
-
P. W. Marshall, C. J. Dale, E. A. Burke, G. P. Summers, and G. E. Bender, "Displacement damage extremes in silicon depletion regions," IEEE Trans. Nucl. Sci, vol. 36, no. 6, pp. 1831-1839, 1989.
-
(1989)
IEEE Trans. Nucl. Sci
, vol.36
, Issue.6
, pp. 1831-1839
-
-
Marshall, P.W.1
Dale, C.J.2
Burke, E.A.3
Summers, G.P.4
Bender, G.E.5
-
15
-
-
0024915865
-
Enhanced displacement damage effectiveness in irradiated silicon devices
-
J. R. Srour and R. A. Hartman, "Enhanced displacement damage effectiveness in irradiated silicon devices," IEEE Trans. Nucl, Sci, vol. 36, no. 6, pp. 1825-1830, 1989.
-
(1989)
IEEE Trans. Nucl, Sci
, vol.36
, Issue.6
, pp. 1825-1830
-
-
Srour, J.R.1
Hartman, R.A.2
-
16
-
-
0029492479
-
Further measurements of random, telegraph signals in proton-irradiated CCDs
-
I. H. Hopkins and G. R. Hopkinson, "Further measurements of random, telegraph signals in proton-irradiated CCDs," IEEE Trans. Nucl. Sci, vol. 42, no. 6, pp. 2074-2081, 1995.
-
(1995)
IEEE Trans. Nucl. Sci
, vol.42
, Issue.6
, pp. 2074-2081
-
-
Hopkins, I.H.1
Hopkinson, G.R.2
-
17
-
-
33144483125
-
Hot pixel annealing behavior in CCDs irradiated at -84° C
-
C. J. Marshall, P. W. Marshall, A. Waczynski, E. J. Polidan, S. D. Johnson, R. A. Kimble, R. A. Reed, G. Delo, D. Schlossberg, A. M. Russell, T. Beck, Y. Wen, J. Yagelowich, and R. J. Hill, "Hot pixel annealing behavior in CCDs irradiated at -84° C," IEEE Trans. Nucl, Sci, vol. 52, no. 6, pp. 2672-2677, 2005.
-
(2005)
IEEE Trans. Nucl, Sci
, vol.52
, Issue.6
, pp. 2672-2677
-
-
Marshall, C.J.1
Marshall, P.W.2
Waczynski, A.3
Polidan, E.J.4
Johnson, S.D.5
Kimble, R.A.6
Reed, R.A.7
Delo, G.8
Schlossberg, D.9
Russell, A.M.10
Beck, T.11
Wen, Y.12
Yagelowich, J.13
Hill, R.J.14
-
18
-
-
0000827191
-
-
J. Lindhard, V. Nielsen, M. Scharff, and P. V. Thomsen, Mat. Fys. Medd. Dan. Vid Selsk., vol. 33, no. 10, 1963.
-
(1963)
Mat. Fys. Medd. Dan. Vid Selsk
, vol.33
, Issue.10
-
-
Lindhard, J.1
Nielsen, V.2
Scharff, M.3
Thomsen, P.V.4
-
19
-
-
0024166943
-
High energy electron, induced displacement damage in silicon
-
C. J. Dale, P. W. Marshall, E. A. Burke, G. P. Summers, and E. A. Wolicki, "High energy electron, induced displacement damage in silicon," IEEE Trans. Nucl. Sci, vol. NS-35, pp. 1208-1214, 1988.
-
(1988)
IEEE Trans. Nucl. Sci
, vol.NS-35
, pp. 1208-1214
-
-
Dale, C.J.1
Marshall, P.W.2
Burke, E.A.3
Summers, G.P.4
Wolicki, E.A.5
-
20
-
-
33846298000
-
A framework for understanding displacement damage mechanisms in irradiated silicon devices
-
J. R. Srour and J. W. Palko, "A framework for understanding displacement damage mechanisms in irradiated silicon devices," IEEE Trans. Nucl. Sci, vol. NS-53, pp. 3610-3620, 2006.
-
(2006)
IEEE Trans. Nucl. Sci
, vol.NS-53
, pp. 3610-3620
-
-
Srour, J.R.1
Palko, J.W.2
-
21
-
-
23844447392
-
Monte Carlo treatment of displacement damage in bandgap engineered HgCdTe detectors
-
B. C. Fodness, P. W. Marshall, R. A. Reed, T. M. Jordan, J. C. Pickel, I. Jun, M. A. Xapsos, E. A. Burke, and R. Ladbury, "Monte Carlo treatment of displacement damage in bandgap engineered HgCdTe detectors," in Proc. 7th Eur. Conf. Radiation Its Effects Components Systems, 2003, pp. 479-485.
-
(2003)
Proc. 7th Eur. Conf. Radiation Its Effects Components Systems
, pp. 479-485
-
-
Fodness, B.C.1
Marshall, P.W.2
Reed, R.A.3
Jordan, T.M.4
Pickel, J.C.5
Jun, I.6
Xapsos, M.A.7
Burke, E.A.8
Ladbury, R.9
-
22
-
-
1242265278
-
Proton nonionizing energy loss (NIEL) for device applications
-
I. Jun, M. A. Xapsos, S. R. Messenger, E. A. Burke, R. J. Walters, G. P. Summers, and T. M. Jordan, "Proton nonionizing energy loss (NIEL) for device applications," IEEE Trans. Nucl. Sci, vol. 50, no. 6, pp. 1924-1928, 2003.
-
(2003)
IEEE Trans. Nucl. Sci
, vol.50
, Issue.6
, pp. 1924-1928
-
-
Jun, I.1
Xapsos, M.A.2
Messenger, S.R.3
Burke, E.A.4
Walters, R.J.5
Summers, G.P.6
Jordan, T.M.7
|