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Volumn 102, Issue 3, 2007, Pages

Interference lithography by a soft x-ray laser beam: Nanopatterning on photoresists

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LASER BEAM EFFECTS; PERIODIC STRUCTURES; PHOTORESISTS; POLYMETHYL METHACRYLATES;

EID: 34548040217     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2764244     Document Type: Article
Times cited : (37)

References (15)
  • 5
    • 34548043943 scopus 로고    scopus 로고
    • Proceedings of the fifth EUVL Symposium Barcelona, Spain 15-18 October
    • Proceedings of the fifth EUVL Symposium Barcelona, Spain, 15-18 October 2006 (unpublished).
    • (2006)
  • 12
    • 34548030417 scopus 로고    scopus 로고
    • Website: https:\www.cxro-lbl.gov


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.