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Volumn 54, Issue 8, 2007, Pages 1818-1824

Dual-gate E/E- and E/D-Mode AlGaAs/InGaAs pHEMTs for microwave circuit applications

Author keywords

AlGaAs InGaAs; Dual gate; Enhancement; pHEMTs; Power amplifiers

Indexed keywords

DRAIN CURRENT; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; POWER AMPLIFIERS; SEMICONDUCTING ALUMINUM COMPOUNDS; TRANSISTORS;

EID: 34547921976     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.901054     Document Type: Article
Times cited : (6)

References (19)
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    • S. R. Bahl and J. A. del Alamo, "A new drain-current injection technique for the measurement of off-state breakdown voltage in FET's," IEEE Electron Device Lett., vol. 40, no. 8, pp. 1558-1560, Aug. 1993.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.