Inversion domain boundary in a ZnO film

Philosophical Magazine Letters

Volumn 87, Issue 9, 2007, Pages 687-693

  Liu, Y Z ^a   Yuan, H T ^a   Zeng, Z Q ^a   Du, X L ^a   Han, X D ^b   Xue, Q K ^a   Zhang, Z ^b  

^a INSTITUTE OF PHYSICS   (China)

^b BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FILM PREPARATION; MOLECULAR BEAM EPITAXY; STACKING FAULTS; STRAIN ENERGY; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

GEOMETRIC PHASE METHODS; INVERSION DOMAIN BOUNDARY;

OXIDE FILMS;

EID: 34547702278     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830701446995     Document Type: Article

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