Effect of LaNiO3 electrode on microstructural and ferroelectric properties of Bi3.25Eu0.75Ti3O12 thin films

Thin Solid Films

Volumn 515, Issue 20-21, 2007, Pages 8082-8086

  Kim, Kyoung Tae ^a   Kim, Chang Il ^a   Kim, Jong Gyu ^a   Kim, Gwan Ha ^a  

^a Chung Ang University   (South Korea)

Author keywords

BET; FeRAM; MOD; Thin film

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRICITY; LANTHANUM COMPOUNDS; MICROSTRUCTURE; RANDOM ACCESS STORAGE; THIN FILMS; X RAY DIFFRACTION;

METAL ORGANIC DECOMPOSITION METHODS; RANDOM ACCESS MEMORIES;

ELECTRODES;

EID: 34547670751     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.04.035     Document Type: Article

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