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Volumn 111, Issue 29, 2007, Pages 10758-10760

Field-assisted nanopatterning

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM TIN OXIDE; NANOPATTERNING; PYROLYTIC GRAPHITE; THRESHOLD TIP BIAS;

EID: 34547670187     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp074144c     Document Type: Article
Times cited : (13)

References (21)
  • 8
    • 0029639813 scopus 로고
    • (b) Dagata, J. A. Science 1995, 270, 1625.
    • (1995) Science , vol.270 , pp. 1625
    • Dagata, J.A.1
  • 18
    • 84858098422 scopus 로고    scopus 로고
    • The tip radius is less than 10 nm. The tip height is 20-25 μm. The tip cone angle is less than 30°. The cantilever width is 35 μm, and the cantilever length is 130 μm. Most of the Si/SiO2 tips utilized have s force constant of 0.6 N/m. We have also performed FAN studies using commercial Au-coated Si tips, Cr-coated Si tips, and Au/Cr-coated Si tips MikroMasch Co, but only in the context of directionally depositing the metals from the tip
    • 2 tips utilized have s force constant of 0.6 N/m. We have also performed FAN studies using commercial Au-coated Si tips, Cr-coated Si tips, and Au/Cr-coated Si tips (MikroMasch Co.) but only in the context of directionally depositing the metals from the tip.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.