Chemical shift measurements of PIXE spectra using a position-sensitive crystal spectrometer

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 150, Issue 1-4, 1999, Pages 124-128

  Maeda, K ^a   Tonomura, A ^a,b   Hamanaka, H ^b   Hasegawa, K ^b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b HOSEI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ION BEAMS; PHOSPHORUS; PROTONS; SILICON; SPECTROMETERS; X RAYS;

CHEMICAL SHIFT; CHEMICAL STATE ANALYSIS; PARTICLE INDUCED X RAY EMISSION; POSITION SENSITIVE CRYSTAL SPECTROMETER;

X RAY SPECTROSCOPY;

EID: 0033515206     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00927-6     Document Type: Article

References (10)

1. Maeda K., Hasegawa K., Hamanaka H., Ogiwara K. Nucl. Instr. and Meth. B. 134:1998;418.
2. Maeda K., Hasegawa K., Hamanaka H., Maeda M. Nucl. Instr. and Meth. B. 136-138:1998;994.
3. Takahashi Y. Bull. Chem. Soc. Japan. 46:1973;2039.
4. Hamanaka H., Ohura M., Yamamoto Y., Morita S., Iwamura K., Ishii K. Nucl. Instr. and Meth. B. 35:1988;75.
5. Bearden J.A. Rev. Mod. Phys. 39:1967;78.
6. Hannay N.B., Smyth C.P. J. Amer. Chem. Soc. 68:1946;171.
7. Graeffe G., Juslen H., Karras M. J. Phys. B. 10:1977;3219.
8. Kikuchi M., Maekawa T., Yokokawa T. Bull. Chem. Soc. Japan. 52:1979;1260.
9. McWherter J., Olsen D.K., Wolter H.H., Moore F. Phys. Rev. A. 10:1974;200.
10. Fichter M. Spectrochim. Acta. 30B:1975;417.