Chemical state analysis in air by high-resolution PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 994-999

  Maeda, K ^a   Hasegawa, K ^b   Hamanaka, H ^b   Maeda, M ^c  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b HOSEI UNIVERSITY   (Japan)

^c TOKYO UNIVERSITY OF MARINE SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Chemical state analysis; High resolution PIXE; In air PIXE

Indexed keywords

ALUMINUM COMPOUNDS; ATMOSPHERIC PRESSURE; ELECTROMAGNETIC WAVE EMISSION; PARTICLE BEAMS; PARTICLE SPECTROMETERS; POTASSIUM COMPOUNDS; PROTONS; SILICON COMPOUNDS; SULFUR COMPOUNDS; X RAY SPECTROSCOPY;

CHEMICAL STATE ANALYSIS; PROTON INDUCED X RAY EMISSION;

AIR POLLUTION;

EID: 0032021236     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00820-3     Document Type: Article

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