Tomographic imaging and scanning thermal microscopy: Thermal impedance tomography

Thermochimica Acta

Volumn 385, Issue 1-2, 2002, Pages 19-32

  Smallwood, R ^a   Metherall, P ^a   Hose, D ^a   Delves, M ^b   Pollock, H ^c   Hammiche, A ^c   Hodges, C ^c   Mathot, V ^d   Willcocks, P ^e  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b NA Software   (United Kingdom)

^c LANCASTER UNIVERSITY   (United Kingdom)

^d DSM RESEARCH   (Netherlands)

^e AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

Author keywords

Polymers; Scanning thermal microscopy; Sensitivity matrix; Tomographic imaging

Indexed keywords

POLYMER;

ACCURACY; ARTICLE; CALCULATION; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; IMAGING; SCANNING ELECTRON MICROSCOPY; TECHNIQUE; THREE DIMENSIONAL IMAGING;

EID: 0037170541     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6031(01)00705-5     Document Type: Article

References (6)