Microstructure and mechanical properties of heat-treated GeSb 2Te4 thin films

Journal Wuhan University of Technology, Materials Science Edition

Volumn 22, Issue 2, 2007, Pages 196-200

  Ding, Jianning ^a   Xie, Guoxin ^b   Fan, Zhen ^a   Fu, Yongzhong ^a   Ling, Zhiyong ^a  

^a JIANGSU UNIVERSITY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Annealing; Friction; GeSb2Te4 films; Mechanical properties; Microstructure

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAT TREATMENT; MAGNETRON SPUTTERING; MECHANICAL PROPERTIES; MICROSTRUCTURE; THIN FILMS; X RAY DIFFRACTION;

ELECTRIC FORCE MICROSCOPE (EFM); GESB2TE4 FILMS; LUBRICATIVE PROPERTIES; STRUCTURE TRANSITION;

SEMICONDUCTING GERMANIUM COMPOUNDS;

EID: 34547237710     PISSN: 10002413     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11595-005-2196-6     Document Type: Article

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