Friction behavior of nanoscale GeSb2Te4 thin film in atmosphere

Mocaxue Xuebao/Tribology

Volumn 24, Issue 5, 2004, Pages 411-414

  Zhu, Shou Xing ^a,b   Ding, Jian Ning ^a   Fan, Zhen ^a   Li, Chang Sheng ^a   Cai, Lan ^a   Yang, Ji Chang ^a  

^a JIANGSU UNIVERSITY   (China)

^b DONGHUA UNIVERSITY   (China)

Author keywords

Adhesion force; Friction behavior; GeSb2Te4 film; Lateral force microscope

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA RECORDING; FRICTION; MAGNETRON SPUTTERING; PHASE TRANSITIONS;

ADHESION FORCE; FRICTION BEHAVIOR; GESB2TE4 FILM; LATERAL FORCE MICROSCOPE;

THIN FILMS;

EID: 10844249481     PISSN: 10040595     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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