Spectroscopic evidence for a surface layer in CuIn Se2: Cu deficiency

Applied Physics Letters

Volumn 91, Issue 2, 2007, Pages

  Han, Sung Ho ^a,c   Hasoon, Falah S ^a   Hermann, Allen M ^b   Levi, Dean H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b UNIVERSITY OF KENTUCKY   (United States)

^c UNIVERSITY OF CALIFORNIA SAN DIEGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIGS PHOTOVOLTAIC DEVICE; INTERACTION ENERGY; NEAR-SURFACE REGION; SURFACE LAYER ENGINEERING;

ELLIPSOMETRY; ENERGY GAP; PHOTOVOLTAIC CELLS; POLYCRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS;

THIN FILMS;

EID: 34547167879     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2755718     Document Type: Article

References (19)

1. D. E. Aspnes and J. B. Theeten, Phys. Rev. B 20, 3292 (1979).
2. K. Ramanathan, M. A. Contreras, C. L. Perkins, S. Asher, F. S. Hasoon, J. Keane, D. Young, M. Romero, W. Metzger, R. Noufi, J. Ward, and A. Duda, Prog. Photovoltaics 11, 225 (2003).
3. J. A. M. Abushama, S. Johnston, T. Moriarty, G. Teeter, K. Ramanathan, and R. Noufi, Prog. Photovoltaics 12, 39 (2003).
4. A. Niemegeers, M. Burgelman, R. Herberholz, U. Rau, D. Hariskos, and H.-W. Schock, Prog. Photovoltaics 6, 407 (1998).
5. R. Herberholz, U. Rau, H. W. Schock, T. Haalboom, T. Gödecke, F. Ernst, C. Beilharz, K. W. Benz, and D. Cahen, Eur. Phys. J.: Appl. Phys. 6, 131 (1999).
6. D. Schmid, M. Ruckh, F. Grunwald, and H. W. Schock, J. Appl. Phys. 73, 2902 (1993).
7. C.-S. Jiang, F. S. Hasoon, H. R. Moutinho, H. A. Al-Thani, M. J. Romero, and M. M. Al-Jassim, Appl. Phys. Lett. 82, 127 (2003).
8. Y. Yan, K. M. Jones, J. Abushama, M. Young, S. Asher, M. M. Al-Jassim, and R. Noufi, Appl. Phys. Lett. 81, 1008 (2002).
9. M. J. Romero, K. M. Jones, J. Abushama, Y. Yan, M. M. Al-Jassim, and R. Noufi, Appl. Phys. Lett. 83, 4731 (2003).
10. D. Liao and A. Rockett, Appl. Phys. Lett. 82, 2829 (2003).
11. I. M. Kötschau and H. W. Schock, J. Phys. Chem. Solids 64, 1559 (2003).
12. F. S. Hasoon, Y. Yan, H. Althani, K. M. Jones, H. R. Moutinho, J. Alleman, M. M. Al-Jassim, and R. Noufi, Thin Solid Films 387, 1 (2001).
13. S.-H. Han, F. S. Hasoon, H. A. Al-Thani, A. M. Hermann, and D. H. Levi, Appl. Phys. Lett. 86, 021903 (2005).
14. S.-H. Han, C. Persson, F. S. Hasoon, H. A. Al-Thani, A. M. Hermann, and D. H. Levi, Phys. Rev. B 74, 085212 (2006).
15. H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry: A User's Guide, 1st ed. (Wiley, New York, 1999), p. 101.
16. S.-H. Han, A. M. Hermann, F. S. Hasoon, H. A. Al-Thani, and D. H. Levi, Appl. Phys. Lett. 85, 576 (2004).
17. C. Persson and A. Zunger, Phys. Rev. Lett. 91, 266401 (2003).
18. M. I. Alonso, K. Wakita, J. Pascual, M. Garriga, and N. Yamamoto, Phys. Rev. B 63, 075203 (2001).
19. J. L. Shay and J. H. Wernick, Ternary Chalcopyrite Semiconductors: Growth, Electronic Properties, and Applications, 1st ed. (Pergamon, Oxford, 1975).