Effect of Cu deficiency on the defect levels of Cu0.86 In1.09 Se2.05 determined by spectroscopic ellipsometry

Applied Physics Letters

Volumn 86, Issue 2, 2005, Pages

  Han, Sung Ho ^a,b   Hasoon, Falah S ^a   Al Thani, Hamda A ^a   Hermann, Allen M ^b   Levi, Dean H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL-POINT PARABOLIC BAND (CPPB); DIELECTRIC FUNCTIONS; MEAN-SQUARED ERRORS; SODA-LIME GLASS (SLG);

AUGER ELECTRON SPECTROSCOPY; CRYSTAL DEFECTS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; LIGHT ABSORPTION; PHOTOLUMINESCENCE; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER COMPOUNDS;

EID: 19744382926     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1849840     Document Type: Article

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