Temperature monitor: A new tool to profile charge distribution in NROM™ memory devices

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2006, Pages 534-540

  Avital, Lior ^a   Padovani, Andrea ^b   Larcher, Luca ^b   Bloom, Ilan ^a   Arie, Ruzin ^c   Pavan, Paolo ^b   Eitan, Boaz ^a  

^a Saifun Semiconductors   (Israel)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION TOOLS; ERASE BIAS OPTIMIZATION; MEMORY CELLS;

CHARGE DISTRIBUTION; CHARGE TRAPPING; ELECTRONS; OPTIMIZATION; TEMPERATURE CONTROL;

ROM;

EID: 34250740385     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2006.251275     Document Type: Conference Paper

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