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Volumn , Issue , 2006, Pages 301-305

Fabrication of high Ge content SiGe layer on Si by Ge condensation technique

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34250637204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2006.251050     Document Type: Conference Paper
Times cited : (4)

References (13)
  • 1
    • 5444275992 scopus 로고    scopus 로고
    • Si/SiGe heterostructures: From material and physics to devices and circuits
    • D.J. Paul, "Si/SiGe heterostructures: from material and physics to devices and circuits", Semiconductor Science and Technology, 19 (10), R75 - R108 (2004)
    • (2004) Semiconductor Science and Technology , vol.19 , Issue.10
    • Paul, D.J.1
  • 4
    • 0035300641 scopus 로고    scopus 로고
    • Japanese Journal of Applied Physics, Part 1
    • 40 4B
    • T. Tezuka, N. Sugiyama, T. Mizuno, M. Suzuki and S. Takagi, "A novel fabrication technique of ultra-thin and relaxed SiGe buffer layers with high Ge fraction for sub-100 nm strained silicon-on-insulator MOSFETs", Japanese Journal of Applied Physics, Part 1, 40 (4B), 2866-2874 (2001)
    • (2001) , pp. 2866-2874
    • Tezuka, T.1    Sugiyama, N.2    Mizuno, T.3    Suzuki, M.4    Takagi, S.5
  • 6
    • 0242498422 scopus 로고    scopus 로고
    • Characterization of 7-nm-thick strained Ge-on-insulator layer fabricated by Gecondensation technique
    • S. Nakaharai, T. Tezuka, N. Sugiyama, Y. Moriyama, and S. Takagi, "Characterization of 7-nm-thick strained Ge-on-insulator layer fabricated by Gecondensation technique", Applied Physics Letters, 83 (17), 3516-3518 (2003)
    • (2003) Applied Physics Letters , vol.83 , Issue.17 , pp. 3516-3518
    • Nakaharai, S.1    Tezuka, T.2    Sugiyama, N.3    Moriyama, Y.4    Takagi, S.5
  • 9
    • 4544224620 scopus 로고    scopus 로고
    • On the origin of strain fluctuation in strained-Si grown on SiGe-on-insulator and SiGe virtual substrates
    • K. Kutsukake, N. Usami, T. Ujihara, K. Fujiwara, G. Sazaki and K. Nakajima, "On the origin of strain fluctuation in strained-Si grown on SiGe-on-insulator and SiGe virtual substrates", Applied Physics Letters, 85(8), 1335-1337 (2004)
    • (2004) Applied Physics Letters , vol.85 , Issue.8 , pp. 1335-1337
    • Kutsukake, K.1    Usami, N.2    Ujihara, T.3    Fujiwara, K.4    Sazaki, G.5    Nakajima, K.6
  • 10
    • 33744578771 scopus 로고
    • Length mismatch in random semiconductor alloys. III. Crystalline and amorphous SiGe
    • N. Mousseau and M.F. Thorpe, "Length mismatch in random semiconductor alloys. III. Crystalline and amorphous SiGe", Physical Review B, 46 (24), 15887 - 15893 (1992)
    • (1992) Physical Review B , vol.46 , Issue.24 , pp. 15887-15893
    • Mousseau, N.1    Thorpe, M.F.2
  • 12
    • 20444478646 scopus 로고    scopus 로고
    • Germanium movement mechanism in SiGe-on-insulator fabricated by modified Ge condensation
    • 064504-1/5
    • Z. Di, P.K. Chu, M. Zhang, W. Liu, Z. Song, and C. Lin, "Germanium movement mechanism in SiGe-on-insulator fabricated by modified Ge condensation", Journal of Applied Physics, 97 (6), 064504-1/5 (2005)
    • (2005) Journal of Applied Physics , vol.97 , Issue.6
    • Di, Z.1    Chu, P.K.2    Zhang, M.3    Liu, W.4    Song, Z.5    Lin, C.6
  • 13
    • 0037135868 scopus 로고    scopus 로고
    • 0.80 layers, Physical Review Letters, 89 (8), 085902/1-4 (2002)
    • 0.80 layers", Physical Review Letters, 89 (8), 085902/1-4 (2002)


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