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Volumn 601, Issue 12, 2007, Pages 2453-2458

Temperature-dependent energy thresholds for ion-stimulated defect formation in solids: Effects of ion mass and adsorbate-substrate pairing

Author keywords

Diffusion; Interactions of atoms and molecules with surfaces; Ion radiation effects; Semiconductors

Indexed keywords

GERMANIUM; ION BOMBARDMENT; MOLECULAR INTERACTIONS; SEMICONDUCTOR MATERIALS; SILICON; SURFACE DIFFUSION;

EID: 34249864420     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.159     Document Type: Article
Times cited : (2)

References (32)
  • 29
    • 0002427970 scopus 로고
    • Diffusion in Silicon and Germanium
    • Murch G.E., and Nowick A.S. (Eds), Academic, New York
    • Frank W., Gosele U., Mehrer H., and Seeger A. Diffusion in Silicon and Germanium. In: Murch G.E., and Nowick A.S. (Eds). Diffusion in Crystalline Solids (1984), Academic, New York 64
    • (1984) Diffusion in Crystalline Solids , pp. 64
    • Frank, W.1    Gosele, U.2    Mehrer, H.3    Seeger, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.