Far-field optical superlens

Nano Letters

Volumn 7, Issue 2, 2007, Pages 403-408

  Liu, Zhaowei ^a   Durant, Stéphane ^a   Lee, Hyesog ^a   Pikus, Yuri ^a   Fang, Nicolas ^a   Xiong, Yi ^a   Sun, Cheng ^a   Zhang, Xiang ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION LIMITS; NANOSCALE IMAGING; SUPERLENS;

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE PROPAGATION; IMAGING SYSTEMS; PHOTOLITHOGRAPHY; REFRACTIVE INDEX; WAVELENGTH;

LENSES;

EID: 33847756799     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl062635n     Document Type: Article

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