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Volumn 3, Issue 6, 2006, Pages 155-163

Cu-Cu room temperature bonding - Current status of Surface Activated Bonding(SAB)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP ON CHIP CONFIGURATION; IONIC WAFERS; NANO-ADHESION LAYERS; SURFACE ACTIVATED BONDING(SAB);

EID: 34249294062     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2357065     Document Type: Conference Paper
Times cited : (24)

References (14)
  • 6
    • 0034835192 scopus 로고    scopus 로고
    • T. Suga, K. Otsuka, IEEE, 51st, Electronic Components & Technology Conference (ECTC), Orlando, May 29 - June 1, 1003-1008 (2001)
    • T. Suga, K. Otsuka, IEEE, 51st, Electronic Components & Technology Conference (ECTC), Orlando, May 29 - June 1, 1003-1008 (2001)
  • 12
    • 33845593574 scopus 로고    scopus 로고
    • A. Shigetou, T. Itoh, and T. Suga, IEEE 56th, Electronic Components & Technology Conference (ECTC), pp. 1223-1226 (2006)
    • A. Shigetou, T. Itoh, and T. Suga, IEEE 56th, Electronic Components & Technology Conference (ECTC), pp. 1223-1226 (2006)
  • 13
    • 10444249559 scopus 로고    scopus 로고
    • T. Suga, T. H. Kim, and M. M. R. Howlader, IEEE, 54th, Electronic Components & Technology Conference (ECTC), pp. 484-490 (2004)
    • T. Suga, T. H. Kim, and M. M. R. Howlader, IEEE, 54th, Electronic Components & Technology Conference (ECTC), pp. 484-490 (2004)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.