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Volumn 36, Issue 4, 2007, Pages 507-518

The effect of substrate material and postannealing on the photoluminescence and piezo properties of DC-sputtered ZnO

Author keywords

Annealing; DC magnetron sputtering; Fused silica glass; Multiple substrate; Photoluminescence (PL); Piezoresponse force microscopy (PFM); Sapphire; Silicon

Indexed keywords

INVERSION DOMAINS; MULTIPLE SUBSTRATES; PIEZORESPONSE FORCE MICROSCOPY (PFM);

EID: 34249094920     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0046-8     Document Type: Conference Paper
Times cited : (15)

References (21)
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    • Nanoscale Characterisation of Ferroelectric Materials
    • ed. P. Avouris et al, New York: Springer-Verlag
    • M. Alexe, and A. Gruverman, Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology ed. P. Avouris et al. (New York: Springer-Verlag, 2004).
    • (2004) NanoScience and Technology
    • Alexe, M.1    Gruverman, A.2
  • 11
    • 9644259092 scopus 로고    scopus 로고
    • R. AI Asmar, G. Ferblantier, F. Mailly, P. Gall-Borrut, and A. Foucaran, Thin Solid Films 473, 49 (2005).
    • R. AI Asmar, G. Ferblantier, F. Mailly, P. Gall-Borrut, and A. Foucaran, Thin Solid Films 473, 49 (2005).
  • 18
    • 0031619828 scopus 로고    scopus 로고
    • A. Gruverman, O. Auciello, and H. Tokumoto, Imaging and Control of Domain Structures in Ferroelectric Thin Films via Scanning Force Microscopy (Palo Alto, CA: Annual Reviews Inc., 1998) pp. 101-123.
    • A. Gruverman, O. Auciello, and H. Tokumoto, Imaging and Control of Domain Structures in Ferroelectric Thin Films via Scanning Force Microscopy (Palo Alto, CA: Annual Reviews Inc., 1998) pp. 101-123.
  • 19
    • 34249064221 scopus 로고    scopus 로고
    • Personal communication
    • C. Jagadish, Personal communication.
    • Jagadish, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.