Defect sensitivity in instability and dewetting of thin liquid films: Two regimes of spinodal dewetting

Industrial and Engineering Chemistry Research

Volumn 46, Issue 10, 2007, Pages 3108-3118

  Verma, Ruhi ^a   Sharma, Ashutosh ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LIQUID FILMS; MORPHOLOGY; NUCLEATION; SUBSTRATES; VAN DER WAALS FORCES;

DEFECT-SENSITIVE SPINODAL REGIME (DSSR); SPINODAL DEWETTING; THIN-FILM RUPTURE;

THIN FILMS;

COMPUTER SIMULATION; LIQUID FILMS; MORPHOLOGY; NUCLEATION; SUBSTRATES; THIN FILMS; VAN DER WAALS FORCES;

EID: 34249024781     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie060615q     Document Type: Article

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