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Volumn 36, Issue 4, 2007, Pages 297-306
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Photoluminescence and electroluminescence imaging of carrot defect in 4H-SiC epitaxy
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Author keywords
4H SiC; Carrot type defects; Electroluminescence (EL); Morphological defects; Photoluminescence (PL); Silicon carbide (SiC)
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Indexed keywords
BASAL PLANE FAULTS;
CARROT-TYPE DEFECTS;
MORPHOLOGICAL DEFECTS;
CRYSTAL STRUCTURE;
ELECTROLUMINESCENCE;
EPITAXIAL GROWTH;
NONDESTRUCTIVE EXAMINATION;
PHOTOLUMINESCENCE;
SILICON CARBIDE;
CRYSTAL DEFECTS;
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EID: 34249010601
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-006-0059-3 Document Type: Conference Paper |
Times cited : (22)
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References (12)
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