Structure of Ti4AlN3 - a layered Mn+1AXn nitride

Materials Research Bulletin

Volumn 35, Issue 11, 2000, Pages 1785-1796

  Rawn, C J ^a   Barsoum, M W ^b   El Raghy, T ^b   Procipio, A ^b   Hoffmann, C M ^b   Hubbard, C R ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; MICROANALYSIS; NEUTRON SCATTERING; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

ELECTRON PROBE X RAY MICROANALYSIS; RIETVELD REFINEMENT;

NITRIDES;

EID: 0034240584     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(00)00383-4     Document Type: Article

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