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Volumn 54, Issue 5, 2007, Pages 1165-1170

Quasi 3-D velocity saturation model for multiple-gate MOSFETs

Author keywords

Characteristic length; FinFET; Impact ionization; Multiple gate MOSFET; Substrate current; Trigate; Velocity saturation

Indexed keywords

ELECTRIC FIELD EFFECTS; GATES (TRANSISTOR); GAUSSIAN DISTRIBUTION; IMPACT IONIZATION; SUBSTRATES;

EID: 34247866290     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.894595     Document Type: Article
Times cited : (7)

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  • 8
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  • 9
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  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.