Characterization of thin films produced by the thermal evaporation of silver oxide

Journal of Physics D: Applied Physics

Volumn 40, Issue 9, 2007, Pages 2847-2853

  Al Kuhaili, M F ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION RATES; ELECTRIC CONDUCTIVITY; PARTIAL PRESSURE; SILVER COMPOUNDS; THERMAL EVAPORATION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

NORMAL INCIDENCE TRANSMITTANCE; OXYGEN PARTIAL PRESSURE; SILVER OXIDE (AGO);

THIN FILMS;

EID: 34247512080     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/9/027     Document Type: Article

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