Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE)

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 819-823

  Sahm, H ^a   Charton, C ^a   Thielsch, R ^b  

^a Fraunhofer Institute for Electron Beam and Plasma Technology   (Germany)

^b Southwall Europe GmbH   (Germany)

Author keywords

Magnetron sputtering; Silver oxide; Solar control; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEGRADATION; DEPOSITION; ELLIPSOMETRY; ENERGY DISPERSIVE SPECTROSCOPY; MAGNETRON SPUTTERING; OXIDATION; PLASTICS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILVER; SILVER COMPOUNDS; SYNTHESIS (CHEMICAL); TITANIUM DIOXIDE; TRANSPARENCY; X RAY DIFFRACTION ANALYSIS;

PLASMA OXIDATION; SILVER OXIDE; SOLAR CONTROL; SPECTROSCOPIC ELLIOSOMETRY;

THIN FILMS;

EID: 2142661516     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.266     Document Type: Conference Paper

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