Focused-ion-beam-directed nucleation of InAs quantum dots

Applied Physics Letters

Volumn 90, Issue 16, 2007, Pages

  McKay, H A ^a   Dehne, A ^a   Lee, J Y ^a   Millunchick, J M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL THICKNESS; ION DOSE;

ATOMIC FORCE MICROSCOPY; BUFFER LAYERS; GALLIUM; ION BEAMS; IONS; SEMICONDUCTING INDIUM COMPOUNDS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 34247397083     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2724927     Document Type: Article

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