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Volumn 77, Issue 16, 2000, Pages 2607-2609

Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs

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EID: 0006605378     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1318393     Document Type: Article
Times cited : (50)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.