Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner

Solar Energy Materials and Solar Cells

Volumn 74, Issue 1-4, 2002, Pages 43-50

  Van der Heide, A S H ^a   Bultman, J H ^a   Hoornstra, J ^a   Schonecker A ^a  

^a TNO   (Netherlands)

Author keywords

Contact resistance; Firing; Metallisation; Process control; Screen printing; Series resistance

Indexed keywords

ELECTRIC FAULT LOCATION; ELECTRIC LINES; ELECTRIC RESISTANCE; ERROR DETECTION; FIRING (OF MATERIALS); METALLIZING; OPTIMIZATION; PROCESS CONTROL; SCREEN PRINTING;

CONTACT RESISTANCE;

SILICON SOLAR CELLS;

EID: 0036778461     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00046-6     Document Type: Article

References (4)