The effect of terminal group on the electronic transport property of alkanethiol self-assembled monolayer

Wuli Xuebao/Acta Physica Sinica

Volumn 56, Issue 3, 2016, Pages 1674-1679

  Hu, Hai Long ^a   Zhang, Kun ^a   Wang, Zhen Xing ^a   Kong, Tao ^a   Hu, Ying ^b   Wang, Xiao Ping ^a,b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Conducting atomic force microscopy; Self assembled monolayer; Terminal group; Transport properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINS; ELECTRON TRANSPORT PROPERTIES; MOLECULES; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; SELF ASSEMBLED MONOLAYERS; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY; BINDING ENERGY;

ALKANETHIOL MOLECULES; ALKANETHIOL SELF-ASSEMBLED MONOLAYERS; AU(111) SURFACES; CONDUCTING ATOMIC FORCE MICROSCOPY; ELECTRONIC LOCALIZATION; ELECTRONIC TRANSPORT PROPERTIES; TERMINAL GROUPS; X RAY PHOTOELECTRON SPECTRA; MOLECULAR CHAINS; SPECTRA ANALYSIS; X RAY PHOTOELECTRON SPECTRUM; ZERO-POINT;

BINDING ENERGY; TRANSPORT PROPERTIES;

EID: 34147193376     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (25)

1. Chen J, Reed M A, Rawlett A M. Tour J M 1999 Science 286 1550
2. Sortino S, Petralia S, Conoci S, Bella S D 2003 J. Am. Chem. Soc. 125 1122
3. Li Z L, Wang C K, Li Y, Xue Q K 2005 Chin. Phys. 14 1036
4. Wang W, Huang L, Zhang Y, Li C M, Zhang H Q, Gu N, Shen H Y, Chen T S, Hao L P, Peng L, Zhao L X 2002 Acta Phys. Sin. 51 63 (in Chinese)
5. Slowinski K. Chamberlain R V, Bilewicz R, Majda M 1996 J. Am. Chem. Soc. 118 4709
6. Li H H, Li Y D, Wang C K 2002 Acta Phys. Sin. 51 1239 (in Chinese)
7. Chen Y J, Zhao R G, Yang W S 2005 Acta Phys. Sin. 54 284 (in Chinese)
8. Cui X D, Primak A, Zarate X, Tomfohr J, Sankey O F, Moore A L, Moore T A, Gust D, Nagahara L A, Lindsay S M 2002 J. Phys. Chem. B 106 8609
9. Wold D J, Frisbie C D 2000 J. Am. Chem. Soc. 122 2970
10. Cui X D, Zarate X, Tomfohr J, Sankey O F, Primak A, Moore A L, Moore T A, Gust D, Harris G. Lindsay S M 2002 Nanotechnology 13 5
11. Slowinski K, Chamberlain R V, Miller C J, Majda M 1997 J. Am. Chem. Soc. 119 11910
12. Hu H L, Zhang K, Wang Z X, Wang X P 2006 Acta Phys. Sin. 55 1430 (in Chinese)
13. Wold D J, Frisbie C D 2001 J. Am. Chem. Soc. 123 5549
14. Wold D J, Haag R, Rampi M A, Frisbie C D 2002 J. Phys. Chem. B 106 2813
15. Holmlin R E, Haag R, Chabinyc M L, Ismagilov R F, Cohen A E, Terfort A, Rampi M A 2001 J. Am. Chem. Soc. 123 5075
16. Beebe J M, Engelkes V B, Miller L L, Frisbie C D 2002 J. Am. Chem. Soc. 124 11268
17. Engelkes V B, Beebe J M, Frisbie C D 2004 J. Am. Chem. Soc. 126 14287
18. Pflaum J, Bracco G, Schreiber F, Colorado J R, Shmakova O E, Lee T R, Scoles G. Kahn A 2002 Surf. Sci. 498 89
19. Ulman A 1996 Chem. Rev. 96 1533
20. Saito N, Lee S H, Takahiro I, Hieda J, Sugimura H, Takai O 2005 J. Phys. Chem. B 109 11602
21. Hayashi K, Saito N, Sugimura H, Takai O, Nakagiri N 2002 Langmuir 18 7469
22. Johnson K L 1985 Contact Mechanics (Cambridge: Cambridge University Press) p84
23. Clark D T, Kilcast D, Adams D B, Musgrave W K R 1972 J. Electron Spectrosc. Relat. Phenom. 1 232
24. Wagener K, Batich C, Kirsch B, Wanigatunga S 1989 J. Polym. Sci. Part A 27 2625
25. Nefedov V I, Salyn Y V, Majorova A G, Nazarova L A, Baranovski I B 1974 Zh. Neorg. Khimii 19 1353